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ATI Implements Mentor Graphics Modular TestKompress for Production Test of Advanced 90nm Graphics Processor
WILSONVILLE, Ore.—(BUSINESS WIRE)—June 20, 2006—
Mentor Graphics Corporation (Nasdaq:MENT) today
announced that ATI Technologies Inc. has implemented the Mentor
Graphics TestKompress(R) embedded deterministic test (EDT(TM)) tool.
ATI used Modular TestKompress, a new block-level implementation of
Mentor's EDT methodology that improves compression performance and
routing on large, complex devices. Using the new Modular TestKompress,
ATI achieved significant compression of test time and test data
volume.
"Working closely with Mentor Graphics, we were able to use the
TestKompress product to thoroughly test our new chip at no additional
test cost," said Michael Do, design for test (DFT) architect, ATI
Technologies Inc. "Mentor Graphics continues to deliver
value-enhancing products."
With device complexity growing and process technologies shrinking,
achieving cost-effective high test quality has become increasingly
difficult. Test sizes have grown to keep up with design sizes, and
nanometer processes have created new challenges, requiring more tests
to detect them. The Modular TestKompress tool implements an embedded
compression scheme at the block level that dramatically reduces the
size of the test sets required for today's complex designs, enabling
comprehensive test coverage without sacrificing test throughput.
Modular TestKompress provides designers with a block-based flow
whereby each block, along with associated compression logic, can be
implemented and verified independently. This simplifies the design
flow for large block-based designs and reduces the routing area needed
to connect the compression hardware.
"ATI is at the forefront of device complexity. Working together,
Mentor Graphics adapted the proven TestKompress tool to create a new
manufacturing test methodology that solves ATI's test challenges,"
said Robert Hum, vice president and general manager of the Design
Verification and Test division for Mentor Graphics. "This successful
implementation of Modular TestKompress highlights Mentor's ability to
help its customers achieve higher test quality and lower test cost,
even for the most advanced devices and process geometries."
The TestKompress tool fits easily into most scan-based design
flows and offers the same at-speed test capabilities as Mentor
Graphics FastScan(TM), the industry-leading automatic test pattern
generation (ATPG) tool. The TestKompress tool's patented compression
capabilities reduce the amount of test data required for the detection
of the speed-related defects that are more prevalent at nanometer
process technologies.
About Mentor Graphics Design-for-Test Tools
Mentor Graphics provides the industry's broadest portfolio of DFT
solutions for today's System-on-Chip and deep submicron designs,
including integrated solutions for scan, ATPG, EDT, advanced memory
test, boundary scan, logic built-in self-test and a variety of
DFT-related flows. For more information, visit
www.mentor.com/products/dft.
About Mentor Graphics
Mentor Graphics Corporation (Nasdaq:MENT) is a world leader in
electronic hardware and software design solutions, providing products,
consulting services and award-winning support for the world's most
successful electronics and semiconductor companies. Established in
1981, the company reported revenues over the last 12 months of over
$700 million and employs approximately 4,000 people worldwide.
Corporate headquarters are located at 8005 S.W. Boeckman Road,
Wilsonville, Oregon 97070-7777. World Wide Web site:
http://www.mentor.com/.
Mentor Graphics and TestKompress are registered trademarks and
FastScan is a trademark of Mentor Graphics Corporation. All other
company or product names are the registered trademarks or trademarks
of their respective owners.
Contact:
Mentor Graphics Corporation, Wilsonville
Carole Thurman, 503-685-4716
Email Contact
Sonia Harrison, 503-685-1165
Email Contact
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